| S# |
Lecture |
Course |
Institute |
Instructor |
Discipline |
| 3126 |
Case Study 2 Cycle to Cycle Control
|
Control of Manufacturing Processes (M-I-T)
|
MIT
|
Duane Boning, David Hardt
|
Applied Sciences
|
| 3127 |
Lecture 25 Violating the Abstraction Barrier
|
Circuits and Electronics (M-I-T)
|
MIT
|
Prof. Dr. Anant Agarwal
|
Applied Sciences
|
| 3128 |
Case Study 3 Spatial Modeling
|
Control of Manufacturing Processes (M-I-T)
|
MIT
|
Duane Boning, David Hardt
|
Applied Sciences
|
| 3129 |
Lecture 3 Superposition, Thévenin and Norton
|
Circuits and Electronics (M-I-T)
|
MIT
|
Prof. Dr. Anant Agarwal
|
Applied Sciences
|
| 3130 |
Case Study 4 Modeling the Embossing Imprinting of Thermoplastic Layers
|
Control of Manufacturing Processes (M-I-T)
|
MIT
|
Duane Boning, David Hardt
|
Applied Sciences
|
| 3131 |
Lecture 4 The Digital Abstraction
|
Circuits and Electronics (M-I-T)
|
MIT
|
Prof. Dr. Anant Agarwal
|
Applied Sciences
|
| 3132 |
|
Control of Manufacturing Processes (M-I-T)
|
MIT
|
Duane Boning, David Hardt
|
Applied Sciences
|
| 3133 |
Lecture 5 Inside the Digital Gate
|
Circuits and Electronics (M-I-T)
|
MIT
|
Prof. Dr. Anant Agarwal
|
Applied Sciences
|
| 3134 |
Introduction to Analysis of Variance
|
Control of Manufacturing Processes (M-I-T)
|
MIT
|
Duane Boning, David Hardt
|
Applied Sciences
|
| 3135 |
Introduction — Processes and Variation Framework
|
Control of Manufacturing Processes (M-I-T)
|
MIT
|
Duane Boning, David Hardt
|
Applied Sciences
|
| 3136 |
Lecture 6 Nonlinear Analysis
|
Circuits and Electronics (M-I-T)
|
MIT
|
Prof. Dr. Anant Agarwal
|
Applied Sciences
|
| 3137 |
Mechanical Process Variation
|
Control of Manufacturing Processes (M-I-T)
|
MIT
|
Duane Boning, David Hardt
|
Applied Sciences
|
| 3138 |
Lecture 7 Incremental Analysis
|
Circuits and Electronics (M-I-T)
|
MIT
|
Prof. Dr. Anant Agarwal
|
Applied Sciences
|
| 3139 |
Modeling Testing and Fractional Factorial Models
|
Control of Manufacturing Processes (M-I-T)
|
MIT
|
Duane Boning, David Hardt
|
Applied Sciences
|
| 3140 |
Lecture 8 Dependent Sources and Amplifiers
|
Circuits and Electronics (M-I-T)
|
MIT
|
Prof. Dr. Anant Agarwal
|
Applied Sciences
|
| 3141 |
Nested Variance Components
|
Control of Manufacturing Processes (M-I-T)
|
MIT
|
Duane Boning, David Hardt
|
Applied Sciences
|
| 3142 |
Probability Models of Manufacturing Processes
|
Control of Manufacturing Processes (M-I-T)
|
MIT
|
Duane Boning, David Hardt
|
Applied Sciences
|
| 3143 |
Lecture 9 Mosfet Amplifier Large Signal Analysis (part 1)
|
Circuits and Electronics (M-I-T)
|
MIT
|
Prof. Dr. Anant Agarwal
|
Applied Sciences
|
| 3144 |
Probability Models, Parameter Estimation, and Sampling
|
Control of Manufacturing Processes (M-I-T)
|
MIT
|
Duane Boning, David Hardt
|
Applied Sciences
|
| 3145 |
Process Capability and Alternative SPC Methods
|
Control of Manufacturing Processes (M-I-T)
|
MIT
|
Duane Boning, David Hardt
|
Applied Sciences
|
| 3146 |
|
Control of Manufacturing Processes (M-I-T)
|
MIT
|
Duane Boning, David Hardt
|
Applied Sciences
|
| 3147 |
Response Surface Modeling and Process Optimization
|
Control of Manufacturing Processes (M-I-T)
|
MIT
|
Duane Boning, David Hardt
|
Applied Sciences
|
| 3148 |
Sampling Distributions and Statistical Hypotheses
|
Control of Manufacturing Processes (M-I-T)
|
MIT
|
Duane Boning, David Hardt
|
Applied Sciences
|
| 3149 |
Semiconductor Process Variation
|
Control of Manufacturing Processes (M-I-T)
|
MIT
|
Duane Boning, David Hardt
|
Applied Sciences
|
| 3150 |
Sequential Experimentation
|
Control of Manufacturing Processes (M-I-T)
|
MIT
|
Duane Boning, David Hardt
|
Applied Sciences
|
